‘Characterisation’

A Manufacturingtalk guide

Start with the news release Model 4225-PMU offers I-V sourcing and measurement from Keithley Instruments, which we summarised at the time by saying "Keithley Instruments has released the 4225-PMU Ultra Fast I-V Module for the Model 4200-SCS Semiconductor Characterization System. ". Several months prior to that, we featured the news release Malvern characterisation tools optimise production from Malvern Instruments: "Natureworks is using a variety of material characterisation tools from Malvern Instruments to accelerate product development and achieve high quality standards.".
 
In December 2009, we covered the news from Emerson Process Management - take a look at S-series platform features electronic marshalling which says: "Emerson Process Management has announced the S-series platform featuring I/O on demand and electronic marshalling. ".
 
Take a look also at the news release from EOS Electro Optical Systems, EOS presents laser-sintering materials at Euromold, as well as NI introduces PXI semiconductor suite from National Instruments, and X-ray spectrometer aids surface characterisation from Thermo Fisher Scientific.
 

Latest stories...
Malvern integrates Kaiser analysers into platform (October 2009)

Malvern Instruments and Kaiser Optical Systems have announced a development collaboration.

How surface issues affect air-travel emissions (September 2009)

Ceram has published a paper outlining how techniques for the chemical and topographical characterisation of surfaces and interfaces can help the aerospace industry reduce its environmental impact.

Buehler signs Nikon microscope agreement (August 2009)

Buehler has signed an agreement with Nikon Instruments to supply Nikon microscopes as part of its metallographic equipment offering.

NI partners Test System Strategies (July 2009)

National Instruments (NI) has announced a collaboration with Test System Strategies (TSSI) on a software tool that is compatible with NI Labview graphical system design software.

Test system gives accurate vibration measurements (July 2009)

National Instruments has announced a portable bus-powered dynamic signal acquisition (DSA) module and a suite of vibration sensors suitable for making high-accuracy vibration measurements.

NI announces PXI Express-based test instruments (July 2009)

National Instruments has introduced two 32-channel PXI Express-based digital instruments and an eight-slot high-bandwidth PXI Express 3U chassis for advanced automated test applications.

Measurement system provides 3D surface maps (June 2009)

Zemetrics has introduced its Zemapper interferometric optical profiler that provides 3D surface maps with high lateral and vertical resolution in an automated process.

Zetasizer delivers automated aggregate detection (May 2009)

The Zetasizer APS (auto plate sampler) from Malvern Instruments is claimed to deliver fully automated measurement of protein size, with no compromise in data accuracy or quality.

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