Electronics manufacturing: quality control equipment, software
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Showing 26-50 of 110 articles
Support for evaluation kits with validation
Kozio has announced support for Applied Micro Circuit's new PowerPC 440SPe Katmai, 440EPx Sequoia, 440GRx Rainier and 440GX Taishan Evaluation Kits.
News from Kozio, Nov 7, 2006
PC based LCD inspection and analysis product
The Value Engineering Alliance, a leading provider of machine vision solutions, has added a LCD inspection product, VIDIASYS, to its suite of application-specific solutions.
News from Value Engineering Alliance, Nov 7, 2006
X ray systems installed in Scotland
Production automation system specialist, Contax , has recently installed four phoenix x-ray systems at different organisations in Scotland.
News from Contax, Oct 26, 2006
Diagnostics software comes with reference design
Kozio has announced that evaluation versions of the company's kDiagnostics software product now ship with ADI Engineering's new Sidewinder XScale IXP465 Access Gateway Reference Design.
News from Kozio, Oct 12, 2006
Surface insulation resistance standards revised
Gen3 Systems has announced the release of revised Surface Insulation Resistance (SIR) standards designed to improve reliability and integrity testing of products assembled with lead-free solder.
News from Gen3 Systems, Oct 9, 2006
List holds RoHS exempt products
Electronics distributor has produced a comprehensive list of RoHS exempt products including those formally approved, those rejected, any in limbo and ones requested but still pending.
News from Farnell InOne, Aug 22, 2006
Software manages networked wafer readers
Network automation software includes tools to manage a system of networked In-Sight wafer readers throughout the fab, from any networked PC inside or outside of the cleanroom.
News from Cognex UK, Aug 15, 2006
Keithley sponsors Weblog for semiconductor testing
The first Weblog, or Blog, for engineers confronting testing issues in the semiconductor industry informs of the latest technical and business developments and their impact on testing.
News from Keithley Instruments, Aug 15, 2006
Brochure available
Zoom lens enhances electronics part inspection
Designed for use with 1/2in or 1/3rdin CCD cameras a high performance TV Macro Zoom Lens benefit a range of surface inspection tasks including PCB inspection and components production monitoring.
News from Moritex Europe, Jul 26, 2006
Glow discharge spectrometer has high resolution
Glow discharge spectrometer has new high speed electronics that improve the depth resolution to <1nm and a pulsed RF source handles even thermally sensitive layers with ease.
News from Horiba Jobin Yvon, Jul 24, 2006
Traditional solderability test methods questioned
Lead-free use has exacerbated the need to distinguish between solderability and 'soldering ability' tests to maintain integrity of electronic assemblies, writes Graham Naisbitt.
News from Gen3 Systems, Jul 24, 2006
Ensure products withstand high voltages
Ensuring a product remains electrically safe - John Barnett explains how technical advances ensure the effective production line use of electrical flash/hi pot/dielectric withstand testing.
News from Clare Instruments, Jul 17, 2006
Brochure available
Electronics test firm supports networked processor
Provider of embedded functional test and diagnostics capabilities for board bring-up, manufacturing test and power-on self test, supports AMCC's PowerPC 405EZ networked industrial processor.
News from Kozio, Jul 5, 2006
Camera for enhanced dry etch endpoint control
Building on more than 10 years experience in interferometric endpoint control of semiconductor dry etch and deposition processes, Horiba Jobin Yvon has released the latest LEM camera.
News from Horiba Jobin Yvon, Jun 5, 2006
Information and resources for RoHS compliance
Farnell InOne, the number one source for RoHS compliant products and information, has re-energised its dedicated RoHS website.
News from Farnell InOne, Jun 2, 2006
Rapid rate thermal cycle chamber tests electronics
A rapid rate thermal cycle chamber for testing and monitoring miniaturised high density semiconductor devices provides a rapid temperature change of at least 20 deg C/minute.
News from Unitemp, May 23, 2006
Colour sensor board measures light sources
Colour sensor board measures active light sources, such as LED mixed color control, also integrates the complete signal processing, including the interface and measurement control.
News from MAZeT, May 15, 2006
High performance PCB inspection system purchased
A UK contract electronics manufacturer has purchased a high performance portable PCB inspection system and estimates that the time savings could increase production output by some 50%.
News from Contax, May 15, 2006
Lead-free solder connections tested reliably
Lead-free soldering will soon be mandatory in the EU (EU guideline 2002/95/EG) and to ensure lead-free solder connections are tested relaibly,standard and customised machines are available.
News from Zwick Testing Machines, Apr 28, 2006
Brochure available
Focused infra-red simplifies lead-free BGA rework
Eliminating the risk and guesswork from thermal profiling, infra-red light energy takes the board and component to a safe temperature, yet will melt the solder between them.
News from PDR SMT/BGA Rework Solutions, Apr 21, 2006
Cost-effective epoxy is thermally conductive
Cost effective, rapid curing, thermally conductive, one part epoxy has been introduced for high performance potting, encapsulation and underfill applications.
News from Master Bond, Mar 27, 2006
Brochure available
How to identify lead-free parts from 100 makers
UK electronics components stocking distributor has produced a simple guide to assist electronic component buyers to identify lead free components from major manufacturers.
News from Cyclops Electronics, Mar 16, 2006
Instruments perform electronic functional tests
Instruments are designed for functional test and I-V characterisation of silicon and compound semiconductor devices like FETs, diodes, voltage regulators, and optoelectronic components.
News from Keithley Instruments, Mar 9, 2006
Brochure available
System conforms to IEEE for checking nanotubes
Semiconductor characterisation System conforms to and supports the just-released Institute of Electrical and Electronic Engineers' standard for electrical testing of carbon nanotubes.
News from Keithley Instruments, Mar 9, 2006
Brochure available
AOI System guarantees highest fault coverage
A stand-alone inspection system is based on AOI hardware platform and enables a high fault coverage as well as a flexible and efficient usage in the production process.
News from Göpel electronic GmbH, Mar 6, 2006
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