Electronics manufacturing: quality control equipment, software

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Meeting WEEE directive compliance

By 1st July 2006, companies selling electronics products to the European Union nations and China must ensure that their products and components comply with the WEEE directive.

News from DIMA SMT Systems NL ( 3 March 2006)

Semiconductor measurement and metrology described

Brochure describes measurement products fincluding plasma mass spectroscopy, FT-IR metrology, Raman microspectroscopy and numerous X-ray spectroscopies and EDS for electron microscopy.

News from Thermo Electron Corporation (28 February 2006)

Vision robot carries out electronics inspection

Machine vision desktop robot, with its small footprint is ideal for electronics and instrumentation manufacturers who have labour intensive inspection tasks in their quality control process.

News from Digital Inspection Systems ( 8 February 2006)

More miniature USB test devices added

Following the successful launch of a tiny pen-style USB test instrument for high performance analysis, the supplier has added three more devices to its growing family of test equipment.

News from Elan Software Systems ( 8 February 2006)

RF testers made for wireless device makers

A line of RF test instruments, that have unrivaled combination of high performance, speed, flexibility, ease of use, and compact size employ new approaches to test and measurement. Brochure available

News from Keithley Instruments (30 January 2006)

Free soldering poster gives aid for RoHS processes

A2 size wall mounting poster provides advice on PCB soldering techniques to the IPC-A-610C standard for Electronic Engineers and Production Engineers. Brochure available

News from Phoenix Contact (20 January 2006)

RoHS calendar guide prepares electronics users

To help its customers prepare for the up and coming RoHS Directive, an electronics company has developed an easy to use RoHS calendar guide.

News from GSPK Electronics (19 January 2006)

Accessory helps analyse difficult solid samples

Flexible and easy to use, a diffuse reflectance accessory for use with the Evolution 600 UV-Vis spectrophotometer measures samples of almost any size and extremely delicate ones.

News from Thermo Electron Corporation (16 January 2006)

Tool measures wafers to atomic levels

A non-destructive, nanotechnology weight metrology tool - to handle high volume production of 300mm semiconductor wafers - offers atomic layer measurement accuracy.

News from Metryx (12 January 2006)

Boundary scan platform is for flying probes

Boundary Scan Platform for the Scorpion Flying Probe Tester has up to 24 probes that can be freely positioned and used as virtual Boundary Scan pins.

News from Göpel electronic GmbH ( 8 December 2005)

Machine vision inspects solders at lower cost

Technical background article A generic machine concept for PCB manufacturers allows robust solder inspection for a fraction of the price of some of the larger automated optical inspection machines on the market.

News from Industrial Vision Systems (14 November 2005)

High resolution X-ray system inspects PCBs

High resolution X-ray inspection system has an extra large scanning area, a highly precise manipulation unit with a 360 deg rotation axis and the approved ovhm technology for oblique views.

News from Contax (27 October 2005)

Latest electronics production automation shown

Electronics manufacturers can benefit from a cellular component mounter, which has an outstanding combination of speed, accuracy and small footprint At this year's Productronica, Germany

News from Sony Europe, Image Sensing Solutions Division (21 October 2005)

X-ray instruments help to comply with WEEE, RoHS

X-ray instruments automate analysis procedures, are fully enclosed, and can be operated with basic skill levels in the factory with minimal safety requirements. Brochure available

News from Fischer Instrumentation (GB) (19 October 2005)

Inspection system eliminates wafer faults

Low cost wafer inspection system enables electronic component manufacturers producing ceramic or silicon wafers to automatically inspect each wafer optically for faults.

News from Envisage Systems (12 October 2005)

Stencil printer offers 20-30% more throughput

Stencil printer measures performance on throughput, rather than traditional cycle times and offers estimated throughput gains of 20 to 30% over its closest competitor.

News from Contax (12 October 2005)

Flash testing station maintains PCB quality

User application article Latest testing technology using data storage and traceability features is helping an industrial metal detection systems maker comply with international quality and product standards. Brochure available

News from Clare Instruments ( 5 October 2005)

Bench top electrical hi-pot tester introduced

A powerful new bench top electrical hi-pot tester is a compact rugged low cost instrument with an optional built-in PC interface, for small and medium sized manufacturers. Brochure available

News from Clare Instruments ( 5 October 2005)

Optical inspection system checks parts' presence

Automatic optical inspection system determines the presence and absence of components, checks solder joints and bridges and provides feedback to ensure placement accuracy.