Gauging and Hand Tools for Inspection
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Showing 26-50 of 155 articles
Microhmmeter ensures cables meet standards
Cropico has introduced the highly accurate DO5000 microhmmeter for low resistance measurements, helping cables meet technical specifications and saving valuable copper.
News from Cropico, Apr 19, 2007
Embedded technology in digital height gauge range
Bowers Metrology, UK agents for the renowned Trimos Height Gauge range, have announced several advanced new features for the best selling Trimos Vectra Touch range.
News from Bowers Metrology UK, Apr 9, 2007
Flexible digital coating thickness gauges
The material-testing arm of the Bowers Metrology Group - CV Instruments - has launched the CG-300 series, a range of digital coating thickness gauges.
News from Bowers Metrology UK, Apr 9, 2007
Intrinsically safe test tool poster and guide
A free 'Intrinsically Safe Test Tool' poster and product guide is being offered by Fluke, supplier of handheld test and measurement equipment.
News from Fluke (UK), Mar 15, 2007
Large-diameter gauge measures internal, external
Bowers Metrology claims that the gaugemaker MIC 360 large-diameter gauge is able to accurately measure both internal and external diameters of up to 100 ft.
News from Bowers Metrology UK, Mar 12, 2007
Test tools catalogue exceeds 100 pages
Fluke's annual Test Tools Catalogue now exceeds 100 pages and contains details of twenty new products.
News from Fluke (UK), Feb 27, 2007
Industrial multimeters are waterproof to IP67
Extech Instruments has announced its 500 Series of Industrial MultiMeters, ruggedly designed and waterproof to IP67 standards.
News from Extech Instruments, Feb 27, 2007
Test and measurement products in catalogue
Keithley Instruments has announced its 2007 Test and Measurement Product Catalogue, including their general-purpose and sensitive-sourcing and measurement products.
News from Keithley Instruments, Feb 27, 2007
Measurement tutorial CD helps engineers
Keithley Instruments has launched an interactive tutorial CD that helps test engineers with measurement operations.
News from Keithley Instruments, Feb 22, 2007
Award for semiconductor test solutions
Keithley Instruments, a provider of solutions for emerging measurement needs, has been recognised for outstanding customer satisfaction by VLSI Research.
News from Keithley Instruments, Feb 5, 2007
Semiconductor parametric test handbook
Keithley Instruments, a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook.
News from Keithley Instruments, Feb 5, 2007
Guide for displacement, position or temperature
A new measurement product guide has been launched that will help engineers select the correct displacement, position or temperature sensor for their measurement task .
News from Micro-Epsilon UK, Jan 29, 2007
Pressure Gauges for next day delivery
Southern Temperature Sensors has recently taken on a resale agreement for pressure gauges and now has a range of gauges to suit most requirements available from stock.
News from Southern Temperature Sensors, Jan 24, 2007
Precision optics at affordable prices
Edmund Optics (EO) announced that more than 8,500 products for the European marketplace will have lower prices in January, 2007.
News from Edmund Optics, Jan 17, 2007
Robust snap-gauges for 0-150mm ranges
Bowers Metrology is celebrating the success of the company's new range of robust snap-gauges.
News from Bowers Metrology UK, Jan 8, 2007
Hemispherical lenses are made from sapphire
Edmund Optics offers hemispherical lenses made from sapphire.
News from Edmund Optics, Jan 1, 2007
Test software for circuit materials testing
KTE V5.2 from Keighley provides a number of features that dramatically increase throughput for leading-edge circuit materials testing, such as those requiring RF level frequencies
News from Keithley Instruments, Dec 15, 2006
Optics and photonics products at show
Edmund Optics will kick off Photonics West 2007 with its hottest line of Tech Spec optics and photonics products.
News from Edmund Optics, Dec 4, 2006
Low Profile GPIB Controller Interface board
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board.
News from Keithley Instruments, Dec 4, 2006
Height gauge measures flushness of rivets
Rivets that stand proud from, or are located below the surface of an Aircraft's flying surfaces adversely affect both the performance and the fuel efficiency of the Aircraft concerned.
News from Bowers Metrology UK, Dec 4, 2006
Measurement for Semiconductor characterisation
Keithley Instruments has announced the release of KTE Interactive V6.1, an updated version of its powerful KTEI measurement software for its Model 4200-SCS Semiconductor characterisation System.
News from Keithley Instruments, Nov 28, 2006
Hybrid test systems in production applications
Keithley Instruments has introduced a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments.
News from Keithley Instruments, Nov 21, 2006
Probe cards for semiconductor parametric testers
Keithley Instruments has partnered with Mesatronic (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications.
News from Keithley Instruments, Nov 13, 2006
Fast, flexible vector signal analyser for wireless
Keithley Instruments has introduced the Model 2810 RF Vector Signal analyser, optimised for automated testing of wireless devices and transmitter circuits.
News from Keithley Instruments, Nov 7, 2006
Laser mirrors expanded with high energy family
Edmund Optics has expanded its laser mirror line with the introduction of the Tech Spec High Energy Excimer Laser Mirror family.
News from Edmund Optics, Oct 31, 2006
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Mahr to showcase Linear 100 and 36 B at expo
Mahr Federal is to feature its Linear 100 and the 36 B ID/OD indicator gauge at the Westec 2009 Exposition at the Los Angeles Convention Center, CA between 30 March and 2 April 2009.
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