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Non-contact, Optical and Laser measurement systems

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Showing 126-150 of 705 articles

Interface module for infrared thermometer

Micro-Epsilon has launched a low-cost PROFIBUS-DP interface module for its 'optris CT Series' infrared thermometer range.

News from Micro-Epsilon UK, Apr 2, 2007

Brochure availableBrochure available

3D Laser Scanner aids research

Groundbreaking research at the Virginia Polytechnic Institute and State University Transportation Institute is using Laser Design technology.

News from Laser Design, Apr 2, 2007

UV and IR LED illumination sources

The new range of UV and IR LED illumination sources from CCS has been made available by Firstsight Vision in 32 models, offering different illumination geometries for different applications.

News from Firstsight Vision, Mar 27, 2007

Brochure availableBrochure available

Red enhanced bi-cell photodiode

The red enhanced ODD-3W-2 Bi-Cell Photodiode has been introduced by Opto Diode, a manufacturer of advanced performance photodetectors and visible and infrared LEDs.

News from Opto Diode, Mar 27, 2007

Test and measurement tools for optical fibre

Two new test and measurement tools for optical fibre have been introduced by Fujikura Europe, the FLS-20T battery-operated, dual laser light source and the FVI-01 miniature light source.

News from Fujikura Europe, Mar 27, 2007

High optical performance with machine micro lenses

New from Moritex is a low-cost range of Machine Micro Lenses designed to exhibit the highest-level optical performance when combined with 410,000-pixel cameras, the MML-ST series.

News from Moritex Europe, Mar 26, 2007

RoHS compliant LED illumination with power sources

The MG Wave LED lighting range has been supplemented with a suite of constant current Power Sources purpose designed for the lights.

News from Moritex Europe, Mar 26, 2007

Piezo actuators combine high dynamics and travel

PiezoMove actuators combine high dynamics and large travel ranges in a small package and are especially well suited for OEM applications.

News from Lambda Photometrics, Mar 23, 2007

Brochure availableBrochure available

3D laser scanning probes are faster

The next-generation line of 3D laser scanning probes will be available in the second quarter of 2007 from Laser Design.

News from Laser Design, Mar 23, 2007

Reporting tool for optical tests

The FastReporter, a single software tool designed to significantly improve the post-processing, analysis and reporting efficiency of its customers, has been launched by Exfo.

News from EXFO Electro-Optical Engineering, Mar 21, 2007

Wireless position device for robots, inspection

The Leica T-Mac device can be mounted on moving robots, machines, or parts whose position(s) need to be monitored in 6DoF, also used in automated inspection and metrology routines.

News from Leica Geosystems AG, Mar 21, 2007

Testers for access and enterprise network testing

The AXS-110 OTDR for access and enterprise network testing has been announced by Exfo Electro-Optical.

News from EXFO Electro-Optical Engineering, Mar 20, 2007

QoS testing of fibres in networks is automated

An automated Network Quality Monitoring System (NQMS) test solution from Exfo Electro-Optical Engineering is dedicated at maximizing the Quality of Service (QoS) of optical fibre in networks.

News from EXFO Electro-Optical Engineering, Mar 20, 2007

Optical time-domain reflectometers for networks

Exfo Electro-Optical Engineering has introduced its E-Series OTDRs (optical time-domain reflectometers) for end-to-end characterisation of optical networks.

News from EXFO Electro-Optical Engineering, Mar 20, 2007

Photometric infrared spectroscopy analysers

Aspectrics has established a Professional Services Division to demonstrate its commitment to its customers following success with its Encoded Photometric Infrared Spectroscopy (EP-IR) analysers.

News from Aspectrics, Mar 19, 2007

Wafer loader for microscopy inspection

McBain Instruments has announced a lab tool, the Wafer Handler WL150 and WL200 Series, for smooth, reliable and safe handling of wafers up to 200mm.

News from McBain Instruments, Mar 19, 2007

Optical CMM becomes dynamic measuring machine

Metris released K-Series DMM 3.0, the software that upgrades the K-Series Optical CMM system into a "Dynamic Measuring Machine".

News from Metris, Mar 15, 2007

IR thermographic conditional maintenance methods

The General Technical Division (DTG) of the French Electricity company (EDF) has implemented several of Cedip's Silver 420M IR camera's to develop IR thermographic conditional maintenance methods.

News from Cedip Infrared Systems, Mar 15, 2007

Brochure availableBrochure available

Vision system handbook has new sections

With 40% more information than the previous edition, the new publication from Firstsight Vision features new sections on systems, filters, high speed imaging ,UV and IR lighting.

News from Firstsight Vision, Mar 12, 2007

Brochure availableBrochure available

NIR analyser precisely measures ethanol in water

Aspectrics has introduced an application note detailing methods for MultiComponent 2750 EP-NIR analyser achieving precise measurement of water in ethanol when concentrations are 90% or greater.

News from Aspectrics, Mar 9, 2007

Motion detection measurements with pyrodetector

Users of the DigiPyro digital pyrodetector make quick motion detection measurements and save this data in ASCII format with an applications kit - ready to load into any spreadsheet application.

News from Pacer USA, Mar 1, 2007

Brochure availableBrochure available

Infrared source with reflector has wide range

The Axetris Microsystems infrared source with reflector is available through Armstrong Optical.

News from Armstrong Optical, Mar 1, 2007

Prism adapters enable manipulation of optical axis

Moritex has announced additions to its range of prism adapters, enabling manipulation of the optical axis.

News from Moritex Europe, Mar 1, 2007

Automated inspection system for bakery lines

Dipix Europe has installed an advanced automated inspection system at Lantmannen Unibake's bakery plant in Orebro, Sweden.

News from Dipix Europe, Feb 26, 2007

VOA for demanding optical network testing

Exfo Electro-Optical Engineering's IQS-3150 Variable Optical Attenuator (VOA) is suitable for demanding optical network testing offering an industry-leading attenuation range and spectral uniformity.

News from EXFO Electro-Optical Engineering, Feb 23, 2007

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