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Product category: Non-contact, Optical and Laser measurement systems
News Release from: Cedip Infrared Systems | Subject: Jade Swir IR camera
Edited by the Manufacturingtalk Editorial Team on 03 February 2006

Multi-purpose IR camera for thermal
analysis

Available from Cedip Infrared Systems, the Jade Swir is a high sensitivity, multi-purpose IR camera for applications like thermal analysis, process control, IR radiometry/signature analysis, RandD.

Available from Cedip Infrared Systems, the Jade Swir is a high sensitivity, multi-purpose IR camera for applications including online thermal analysis, process control, IR radiometry, IR signature analysis and RandD Benefiting from an advanced TE cooled MCT detector array the Jade Swir provides excellent spectral response from 0.8 to 2.5 microns

The Jade Swir provides broader spectral response than InGaAs based cameras.

This broader spectral response is particularly important for applications requiring excellent sensitivity at infrared wavelengths up to 2500 nm, such as the water absorption band at 1.95 micron.

Operating at up to 200 frames per second at full image size (320 x 256), with output digitised over a complete 14bit dynamic range the Jade Swir provides the leading edge resolution to clarify even the smallest area of defect or non-uniformity.

Coupled with Cedip's powerful, yet intuitive PC-based analysis and reporting software the system provides users with a powerful and cost effective investigative tool. Request a free brochure from Cedip Infrared Systems ...

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