Product category:
Non-contact, Optical and Laser measurement systems
News Release from: Cedip Infrared Systems | Subject: ALTAIR Li system
Edited by the Manufacturingtalk Editorial
Team on 18 August 2006
High quality thermal images of stress
The Altair Li system from Cedip Infrared Systems employs a high performance infrared focal plane array camera to provide high quality thermal images of stress.
The Altair Li system from Cedip Infrared Systems employs a high performance infrared focal plane array camera to provide high quality thermal images of stress in materials and structures under dynamic loading conditions Using proprietary software these thermal images are converted into full field stress images in real time
The Altair Li system has the versatility to provide precise stress testing of structural components under random, transient or dynamic loading.
In applications where there is a large displacement a novel software feature is available to provide accurate motion compensation.
When used to measure heat dissipation on a structure under dynamic loading (D-MODE) the Altair Li system can also be used to rapidly determine the materials fatigue limit and provide information on the damage mechanism involved. Request a free brochure from Cedip Infrared Systems ...
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