Product category:
Surface, Profile and Topology systems
News Release from: Carl Zeiss | Subject: Total Interference Contrast
Edited by the Manufacturingtalk Editorial
Team on 23 May 2003
Optical Height Measurement In The
Nanometer Range
Carl Zeiss has developed a quick, simple and economic solution for the precise measurement of surface topography, roughness and layer thickness such as in the fields of films and coatings.
Quick and simple, Total Interference Contrast works in Circular Polarised Light to eliminate the need for Stage Rotation Carl Zeiss has developed a quick, simple and economic solution for the precise measurement of surface topography, roughness and layer thickness, which will be particularly useful in the rapidly growing field of thin films and coatings
This article was originally published on Manufacturingtalk on 16 Jun 2003 at 8.00am (UK)
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Total Interference Contrast (TIC) permits the measurement of structures to an accuracy of 20 nanometers and a depth of 5 microns.
Unlike traditional polarisation interferometers that use linear polarised light and are dependent on the orientation of the sample, TIC uses circular polarised light.
Regardless of their orientation, structures in the specimen are visualised and measured simply by turning the TIC prism, eliminating the need for stage rotation and speeding up analysis.
The use of circular polarised light also makes TIC insensitive to vibration so additional absorption units are not required.
"TIC offers precise measurement, fast evaluation, easier specimen preparation, rapid analysis of large-area specimens, and simplicity of operation," says Aubrey Lambert, marketing manager at Carl Zeiss UK.
"As a combined analysis system and layer thickness measuring system, the combination of a conventional microscope fitted with TIC compares overwhelmingly with conventional layer thickness measuring devices, such as profilometers or scanning force microscopes.
TIC will be particularly beneficial in the development and production of thin films and coatings, which are already used to form chemically inert PTFE coatings, low friction and wear resistant coatings, optical filters and biocompatible surfaces.
Measurement of step heights and layer thickness is also widely used in electronics, MEMS, glass and ceramics, and the automotive industry.
"There is no reason to expect that technologists will cease to demand high performance, flexibility, and a rapid return on investment from their optical imaging and measurement systems," continues Lambert.
"Innovative optical applications like TIC will continue to ensure that Carl Zeiss remains at the forefront of the industry.".
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