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News Release from: DMIS | Subject: Metrology interoperability
Edited by the Manufacturingtalk Editorial
Team on 29 March 2007
Common metrology interoperability sought
Part of a larger conference on the general topic of interoperability, The NIST Consortium of Consortia Metrology meeting is in response to a need for common metrology standards.
The NIST Consortium of Consortia Metrology meeting is part of a larger conference on the general topic of interoperability ("Interoperability Week 2007") To attend this meeting or any other meeting at the conference, click on the "Registration" tab at the top of the meeting web site and register for either one, two, or three days, as appropriate
This article was originally published on Manufacturingtalk on 13 May 2005 at 8.00am (UK)
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Details about hotels and meals at the meetings can also be found on the same web site.
Meeting summary: In response to the need for a more common vision worldwide in metrology interoperability, a proposal has been made to form a consortium of consortia, in other words, organize the existing groups worldwide working on metrology interoperability into a single consortia to provide structure and unity toward our common goal of component interoperability.
A half-day session is planned to discuss and make plans for such an organisation.
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Meeting detail (also found on the meeting web site): This meeting will debate the organisation of a semi-formal consortium of the various consortia worldwide that are each working to enable standards-based interoperability (plugandplay) in metrology systems.
These consortia include the I++ group, the AIAG MEPT, the DMSC, the IA.CMM, ISO TC184/SC4, NCSLI, and the CMSC.
The impetus for this planned meeting grew out of a concern expressed by metrologists at the IMIS[1] meeting in 2006, that a common vision worldwide for metrology interoperability is needed.
The success of the SASIG[2] consortium is another impetus for calling this meeting.
SASIG has had an important role in the successful implementation of ISO STEP AP214 (automotive design processes).
Will the SASIG effort be a good model to achieve the common vision sought? If yes, the meeting will seek to define what form this new consortium will take: What are the goals of the new group? What will be the required work? Who will lead it? How will the work get done? What kind of memorandum of understanding will the groups define? What kind and level of funding, if any, will be required? Where will such funding come from? Where, when, and how often will meetings be held? If a consortium of consortia is judged not to be a good model, the meeting will seek alternatives to achieve the common vision.
Would a simple memorandum of understanding between the groups suffice? Would a planned yearly meeting suffice, alternating perhaps between Europe (at Control) and the USA (at IMTS)? There is a further meeting planned for the following two days, April 24 - 25, 2007, also to be held at NIST.
At this meeting, metrologists will discuss the utility of a new interface standard defining high-level inspection process planning (HIPP) information.
HIPP information is intended to allow inspection process planning software to unambiguously define an inspection process plan without human input.
This process is already well underway in proprietary systems, so the idea is to define a non-proprietary (i.e., standard) version of this kind of information.
These two meetings are open to any interested parties.
Metrologists and manufacturing quality managers from user, supplier, and vendor companies interested in enabling standards-based interoperability are particularly urged to attend.
To register for either or both of these two meetings, click on the Web Site specified above and click on the "Registration" tab at the top of this page and register for either one, two, or three days.
Details about hotels and meals at the meetings can also be found on this web site.
NIST Consortium of Consortia Metrology Meeting: April 23, 2007 from 1:00PM - 5:00PM, National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland.
Meeting organizers: Dimensional Metrology Standards Consortium (DMSC) and the Automotive Industry Action Group (AIAG) Metrology Interoperability Project Team (MEPT).
Meeting host: John Horst of NIST, john.horst@nist.gov , (301) 975-3430.
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