ST400 Optical Profilometer for larger sample sizes

The ST400 Optical Profilometer from Nanovea has 150mm X-Y stages and a large coarse height adjustment to work with larger sample sizes.

It has an optional offset camera, with either manual or motorised zooms, to easily identify small features prior to measuring them.

The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360deg rotational stage for measuring spherical or cylindrical parts and many other custom configurations.

According to Nanovea, the ST400 works well for larger samples and larger scan areas.

It is available with various automation options.

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