<?xml version="1.0" encoding="iso-8859-1"?>
<rss version="2.0">
  <channel>
    <title>RSS News Feed for Envisage Systems - from Manufacturingtalk</title>
    <link>http://www.manufacturingtalk.com/news/evi/evi000.html</link>
    <description>Envisage Systems news releases on Manufacturingtalk</description>
    <language>en-gb</language>
    <copyright>Copyright (C)2008 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Thu, 28 Aug 2008 08:00:00 UT</pubDate>
    <lastBuildDate>Thu, 28 Aug 2008 08:00:00 UT</lastBuildDate>
    <image>
      <title>Pro-Talk Ltd</title>
      <url>http://www.pro-talk.com/images/protalklogo90.gif</url>
      <link>http://www.pro-talk.com/</link>
      <width>90</width>
      <height>79</height>
    </image>
    <item>
      <title>Visual inspection amortises in under two years</title>
      <description>Vision inspection system has decreased the parts per million failure rate on reeled SMT components dramatically, halved the number of full time inspection operators and rework costs are nil.</description>
      <pubDate>Wed, 28 Jun 2006 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi104.html</link>
    </item>
    <item>
      <title>Inspection system eliminates wafer faults</title>
      <description>Low cost wafer inspection system enables electronic component manufacturers producing ceramic or silicon wafers to automatically inspect each wafer optically for faults.</description>
      <pubDate>Wed, 12 Oct 2005 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi103.html</link>
    </item>
    <item>
      <title>High resolution system automates diodes inspection</title>
      <description>Low cost visual measurement system replaces manual inspection, by microscope, of components like capacitors, diodes, resistors, inductors, sensors, varistors, thermistors and multiple chip arrays.</description>
      <pubDate>Mon, 28 Jun 2004 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi102.html</link>
    </item>
    <item>
      <title>Low cost vision system checks electronic parts</title>
      <description>Low cost vision inspection system is designed for the 4 or 6-sided inspection of components such as capacitors, diodes, resistors and other small devices.</description>
      <pubDate>Tue, 01 Jun 2004 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi101.html</link>
    </item>
    <item>
      <title>Camera System Gives Continuous Product Monitoring</title>
      <description>Early detection of defects created by machine drift and material viscosity changes, can improve quality, and significantly reduce costs.</description>
      <pubDate>Thu, 27 Mar 2003 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi105.html</link>
    </item>
    <item>
      <title>Optical checking system is very adapatable</title>
      <description>Originally designed and widely marketed to check capacitors and other surface mount devices an optical system also checks square, rectangular, round and cylindrical parts.</description>
      <pubDate>Tue, 15 Oct 2002 08:00:00 UT</pubDate>
      <category>Envisage Systems</category>
      <link>http://www.manufacturingtalk.com/news/evi/evi100.html</link>
    </item>
  </channel>
</rss>
