Product category:
Non Destructive Testing
News Release from: GE Inspection Technologies | Subject: CRx Tower
Edited by the Manufacturingtalk Editorial
Team on 10 October 2006
Computed radiography imaging system is
certified
The CRx Tower computed radiography imaging system from GE Inspection Technologies using IPS phosphor imaging plates, has been independently certified.
The CRx Tower computed radiography imaging system from GE Inspection Technologies using IPS phosphor imaging plates, has been independently certified to meet the highest system class European and US standards for industrial computed radiography (CR) The certification was carried out by BAM, the German Federal Institute for Materials Research and Testing, who approved the system to Class IP 1/100 within EN 14784-1 and IP Special/100 within ASTM E2446 for a minimum exposure of 3.2mGy
This article was originally published on Manufacturingtalk on 1 Apr 2005 at 8.00am (UK)
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This corresponds to a CEN and ISO film speed of 320 and maximum basic spatial resolution is 100um at 50 um pixel scanning.
The new certification means that inspections can now be carried out with even greater confidence to take advantage of the benefits of computed radiography over conventional film in terms of faster exposures, wider latitude, fewer retakes and significant reductions in materials and labour costs.
The CRx Tower has already been field-proven to offer fast scanning speeds and high throughput and can achieve scan resolutions of up to 50 micron or 20 pixels/mm.
It can use a range of imaging plates from IP Standard, resulting in a D7 film IQI (image quality indication) detection to IP Extra and IPS, both of which offer D4 film IQI detection.
As such, the CRx Tower system finds application throughout the oil and gas, power generation, aerospace and general manufacturing sectors, performing NDT tasks from corrosion monitoring to castings inspection and weld examination.
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