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Hitachi High-Technologies

Whitebrook Park
Lower Cookham Road
Maidenhead
SL6 8YA
UK

Latest articles from this company

News releases from this company

Atomic absorption spectrophotometer autosampler

A new autosampler has been introduced by Hitachi High-Technologies for the Z-2300 flame-only atomic absorption spectrophotometer.

News from Manufacturingtalk, 26 October 2005

Atomic absorption spectrophotometers aid RoHS aps

The Z-2000 series of flame, furnace and tandem atomic absorption spectrophotometers from Hitachi High-Technologies is able to accurately determine low concentrations of toxic elements.

News from Manufacturingtalk, 29 August 2005

Unique 5-Segment BSD For Variable Pressure SEM

A new, 5-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM from Hitachi High-Technologies.

News from Manufacturingtalk, 24 May 2005

Improved display facilities electron microscope

The recently-launched S-3400N variable pressure scanning electron microscope from Hitachi High-Technologies has improved display and signal mixing facilities for greater versatility of operation.

News from Manufacturingtalk, 8 February 2005

VPSEM Gives outstanding performance

The S-3400N variable pressure scanning electron microscope, has new electron optics, detector, pumping system and enhanced sample handling and analysis capabilities, allowing better quality images.

News from Manufacturingtalk, 8 October 2004

New Scanning Transmission Electron Microscope

The HD-2300 scanning transmission electron microscope (Stem) offers improved resolution and significantly enhanced analytical capabilities for materials and semiconductor applications.

News from Manufacturingtalk, 23 March 2004

Transmission Detector For Low Voltage STEM

The S-5200 ultra-high resolution field emission scanning electron microscope (FESEM) from Hitachi High-Technologies Corp can now be equipped with a transmission detector.

News from Manufacturingtalk, 6 October 2003

Ultra-High Resolution Field Emission VPSEM

The S-4300SE/N field emission variable pressure scanning electron microscope (FEVPSEM) has been announced by Hitachi High-Technologies Corporation.

News from Manufacturingtalk, 16 July 2003

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