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Product category: Electronics and Electrical Subcontracting Services
News Release from: International Rectifier | Subject: 600V integrated and protected ballast control IC
Edited by the Manufacturingtalk Editorial Team on 15 December 2006

600V integrated and protected ballast
control IC

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International Rectifier has introduced a 600V fully-integrated and protected ballast control IC for advanced linear fluorescent lamp ballasts which incorporate active power factor correction (PFC).

International Rectifier has introduced a 600V fully-integrated and protected ballast control IC for advanced linear fluorescent lamp ballasts which incorporate active power factor correction (PFC) Today's advanced linear fluorescent ballasts rely on PFC to comply with government regulations

IR's new highly-integrated and fully-protected IRS2166D ballast control IC offers designers much of what they need in a small footprint simplifying their design tasks while delivering a high degree of programmability The new IRS2166D integrates PFC, ballast control and half-bridge driver in a compact monolithic IC.

Its PFC circuitry operates in critical conduction mode for a high power factor (PF) of 0.99, low total harmonic distortion (THD) of less than 10 percent, and also precise DC bus regulation within a tolerance of 2.5 percent.

Many of the protection features are programmable including those for half-bridge over-current, dead-time and preheat-time, preheat and run frequencies, and lamp end-of-life.

Other features include protection from failure of the lamp to strike, filament failures, and DC bus under-voltage reset.

Available in 16-lead DIP and SO lead-free packages, the devices provide 50% duty cycle, integrated bootstrap circuitry, a 15.6V Zener diode clamp on VCC, and typical micro-power startup current of 250uA.

IR's new ballast control IC utilises IR's advanced high-voltage IC process which incorporates next-generation high-voltage level-shifting and termination technology to deliver superior electrical over-stress protection and higher field reliability.

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