Product category:
Programming aids and applications
News Release from: JTAG Technologies | Subject: DataBlaster
Edited by the Manufacturingtalk Editorial
Team on 23 May 2007
JTAG Technologies enhances test services
MRP uses JTAG DataBlaster with QuadPOD signal conditioning interface to manage boundary scan chains
Bedford-based contract electronics manufacturer MRP has added boundary-scan test to its portfolio of test capabilities following its selection of JTAG Technologies and its range of well-proven application development and runtime solutions Not only will boundary-scan complement MRP's existing test solutions (AOI, ICT and functional) but it is also due to play a crucial role in the testing of a range of PCI cards and backplanes MRP will manufacture for a UK-based designer of computer graphics and wall display drivers
This article was originally published on Manufacturingtalk on 10 Apr 2006 at 8.00am (UK)
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Notably the JTAG test standard is employed for more than just basic, 'traditional' single scan chain, interconnect and infrastructure testing.
Dave Jenkins, MRP's Engineering Manager, comments: "JTAG/Boundary-scan testing is an increasing requirement in our industry and, as a CEM offering additional design-for-test support, we need to be able to harness the technology in new and innovative ways".
For example, by working closely with its customers, MRP has devised a number of strategies for testing plug-in card and backplane combinations.
Further reading
ProVision dot6 Test unveiled
JTAG Technologies B.V. Eindhoven electronica 2006 Booth A1.616
Boundary scan support for PCB testing
JTAG Technologies, leading provider of boundary-scan solutions, has announced the industry's most complete support for PCB and systems testing based on IEEE standard 1149.6.
In-circuit test system has integrated test methods
SPEA and JTAG Technologies have announced the integration of their test methods within the SPEA 3030 in-circuit test system.
Whilst both cards and backplanes may have their own boundary-scan chains (for testing in isolation) to test through to edge connectors one of MRP's novel techniques is to have the two chains exchanging data between bus bridges.
"From a manufacturing point of view this makes far more sense than creating a single test chain," continues Jenkins.
To control the two [boundary-scan] chains, MRP is using JTAG Technologies' DataBlaster controller fitted with a QuadPOD signal conditioning interface which can manage up to four such chains.
MRP, again working with its customer, is also devising a series of functional-based 'cluster' tests, for memory banks and communications ports etc...
Deji Fayoyin, MRP's Senior Test Engineer, states: "I have been working with JTAG tools for several years and have been pleased with the flexibility of the software and how easy it is to get both structural interconnect tests and functional cluster tests to the production floor".
"We initially evaluated a number of boundary-scan tool providers," recalls Jenkins, "assessing not only the capabilities of their hardware, ie the ability to control more than one test chain, but also the capabilities of the software and the levels of technical support".
MRP also deemed it important to be using (and promoting their use of) the industry's longest established provider of boundary-scan solutions.
Nick Fairhead, Sales Director of MRP, says: "By selecting JTAG Technologies we've access to a much wider customer base, as their products are seen as the industry de facto".
James Stanbridge, JTAG Technologies' Sales Manager UK, comments: "If you go back far enough, JTAG Technologies came out of Philips, whose engineers proposed and developed the boundary-scan technology in the late 1980s".
"We were truly innovators in the market back then and we continue to bring value with our new tools like JTAG ProVision - so it's a pleasure to be working with MRP as they use our tools to extend their services". Request a free brochure from JTAG Technologies ...
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