Latest news on Manufacturingtalk categorised by supplier
Horiba Jobin Yvon
Please note: More news from Horiba Jobin Yvon on the Laboratorytalk web site
Address:
2 Dalston Gardens
Stanmore
HA7 1BQ
UK
Telephone: (UK) +44 20 8204 8142
Our RSS feed for news from Horiba Jobin Yvon
Request to receive our free email newsletter each week
Listing of all 31 news releases from Horiba Jobin Yvon:
Scanning performed very quickly
Scanning system has novel scanning hardware that enables the image pixel size to be chosen to match features of interest enabling optimised mapping speeds.
News from Horiba Jobin Yvon (14 December 2007)
Glow discharge spectrometer has high resolution
Glow discharge spectrometer has new high speed electronics that improve the depth resolution to <1nm and a pulsed RF source handles even thermally sensitive layers with ease.
News from Horiba Jobin Yvon (24 July 2006)
Camera for enhanced dry etch endpoint control
Building on more than 10 years experience in interferometric endpoint control of semiconductor dry etch and deposition processes, Horiba Jobin Yvon has released the latest LEM camera.
News from Horiba Jobin Yvon ( 5 June 2006)
Spectra database contains linear ranges
A new ICP spectra database has been developed by Horiba Jobin Yvon for its new CCD ICP system the Activa.
News from Horiba Jobin Yvon ( 5 June 2006)
Raman microscope compatible with atomic scope
Horiba Jobin Yvon, a leader in Raman spectroscopy has announced the launch of its new series of LabRAM Raman microscopes compatible with Atomic Force Microscope (AFM) coupling and integration.
News from Horiba Jobin Yvon (20 March 2006)
Molecular characterisation of nanomaterials
Horiba Jobin Yvon has introduced the LabRAM Raman/PL microscope configuration designed to provide everything needed for molecular characterisation of nanomaterials on one bench top system.
News from Horiba Jobin Yvon (25 January 2006)
Fit and forget guided pneumatic cylinder
A new range of guided pneumatic cylinders from Hoerbiger-Origa combines the driving and the guiding elements into a single unitary design that is compact, robust, simple and elegant.
News from Horiba Jobin Yvon ( 7 November 2005)
Combined Raman and FTIR Microscope systems
Horiba Jobin Yvon has announced the launch of its new series of combined Raman and FTIR Microscope systems.
News from Horiba Jobin Yvon ( 4 November 2005)
ICP analysis of volatile organic samples
Horiba Jobin Yvon has introduced a new accessory extending the analysis capability to volatile organic samples with Horiba Jobin Yvon ICP Spectrometers.
News from Horiba Jobin Yvon (26 October 2005)
High performance Raman microscopy made easy
The Horiba Jobin Yvon Raman team has introduced the new LabRAM Aramis, said to be a major advance in Raman automation.
News from Horiba Jobin Yvon (23 May 2005)
Nitrogen analysis for flourescence analysis
Horiba Jobin Yvon has introduced nitrogen analysis for the Horiba SLFA UV 21.
News from Horiba Jobin Yvon (16 February 2005)
Entering the world of ASTM D5453
The SLFA UV21 Sulphur-in-Oil Analyzer offers new technology using a combustion ultraviolet fluorescence to achieve levels of sulphur down to 1 ppm.
News from Horiba Jobin Yvon (29 November 2004)
HIgh sensitivity microanalysis without LN2 cooling
The new Horiba XGT-5100 micro-EDXRF system with liquid nitrogen free detector cooling builds on the past success of the XGT-5000, offering high sensitivity micro-EDXRF elemental analysis and mapping.
News from Horiba Jobin Yvon ( 2 November 2004)
Automatic sampler has USB communications
Automatic sampler, to work with spectrometers, incorporates USB communications enabling additional flexibility, transfer rate and capabilities for different applications.
News from Horiba Jobin Yvon (24 August 2004)
X-Ray analyser designed for WEEE/RoHS, ELV control
Energy dispersive X-ray fluorescence spectrometer provides quantitative, qualitative analysis of all elements from Sodium to Uranium for solid, liquid, powders and particulate samples.
News from Horiba Jobin Yvon (18 August 2004)
Ultra fast acquisition module measures <1nm layers
Improvements made to RF glow discharge optical emission spectrometers for bulk, depth profile and surface analysis include an ultra fast acquisition module for measuring layers under 1nm.
News from Horiba Jobin Yvon ( 4 August 2004)
Catch The Wav With The New Activa
Jobin Yvon has launched Activa ICP featuring simultaneous analysis of all elements and background within a *"Wavelength Analytical View" (Wav) providing performance and productivity.
News from Horiba Jobin Yvon (15 June 2004)
Microscope For Space Efficient Laboratory
Key features of the XGT-5000 are non-destructive microscopic elemental analysis and mapping under atmospheric pressure.
News from Horiba Jobin Yvon ( 5 May 2004)
Spectrometer software offers multi-user levels
Latest version of software for the Metalys Spark Optical Emission Spectrometer offers multi-user levels with password protection and login capacity.
News from Horiba Jobin Yvon (24 November 2003)
Software speeds up accurate alloys production
New software for spark emission spectrometer offers simplicity of operation through well-defined procedures and makes production of accurate alloys easy and fast.
News from Horiba Jobin Yvon ( 7 November 2003)
Thin anodized aluminum reference sample available
New Generation in X-ray Microscopy
Modular QC system operates 24/h/day unmanned
Glow Discharge Spectrometry Gets Hi-Res Hardware
RF generator extends scope of glow discharge unit
Affordable High-Performance In Platform For Future
Productivity and Performance In Future Platform
Worlds first Portable Raman Imaging System
Philips ellipsometry business line acquired
Spectrometer offers future vision platform
Multi-layer coatings analysed in seconds
