Keithley Instruments web site, latest news and contact details

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Address:
Landsberger Str 65
Germering
D-82110
Germany
Telephone: (Germany) +49 89 849307 0

http://www.keithley.com

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Listing of all 55 news releases from Keithley Instruments:

Keithley unveils portable battery/charger tester

Keithley Instruments has introduced the Model 2308 portable battery/charger simulator, a dual-channel battery- and charger-simulating power supply for testing portable battery-powered devices. Brochure available

News from Keithley Instruments (25 September 2008)

Keithley simplifies high performance measurements

Keithley Instruments has announced its Series 2600A system, the latest version of its Source Meter instrument platform. Brochure available

News from Keithley Instruments (25 September 2008)

Precision sourcing and measurement guide published

Keithley Instruments has produced a free resource guide on CD that includes functional test, wafer level reliability, and production testing of electrical components. Brochure available

News from Keithley Instruments (21 May 2008)

Handbook covers test and measurement switching

Keithley Instruments has published its sixth edition of its free 'Switching Handbook: A Guide to Signal Switching in Automated Test Systems'covering test and measurement applications. Brochure available

News from Keithley Instruments (12 May 2008)

Test and measurement guide released

A test and measurement product guide details DC switching, RF switching and measurement, data acquisition, semiconductor test systems, and optoelectronics test hardware. Brochure available

News from Keithley Instruments ( 6 February 2008)

USB digital multimeter ideal for production tests

Keithley Instruments has introduced the Model 2100 61/2-Digit USB digital multimeter which is ideal production test, burn-in and manual and semi-automatic research and development applications Brochure available

News from Keithley Instruments (29 June 2007)

Vector signal generator with modulation abilities

Model 2910 V2.0 includes additional wireless signal generation waveforms, a new power calibration feature, and increased ARB memory Brochure available

News from Keithley Instruments (13 June 2007)

Handbook on nanotechnology measurement

Keithley Instruments has published a handbook on nanotechnology measurement, which offers practical assistance in making precision low level DC and pulse measurements on nanomaterials and devices. Brochure available

News from Keithley Instruments (17 April 2007)

Faster and easier semiconductor testing

Keithley Instruments has announced the availability of ACS (Automated characterisation Suite) integrated test system for semiconductor characterisation at the device, wafer, and cassette level. Brochure available

News from Keithley Instruments (17 April 2007)

Measurement instrument firm's sales drop

Manufacturer of advanced electrical test instruments and systems reports that sales levels for the second quarter of fiscal 2007 fell short of the guidance range. Brochure available

News from Keithley Instruments (16 April 2007)

Pulse capabilities for semiconductor testing

Keithley Instruments has announced enhanced pulse and pulse i-v capabilities for its Model 4200-SCS semiconductor characterisation system. Brochure available

News from Keithley Instruments ( 5 April 2007)

Test and measurement products in catalogue

Keithley Instruments has announced its 2007 Test and Measurement Product Catalogue, including their general-purpose and sensitive-sourcing and measurement products. Brochure available

News from Keithley Instruments (27 February 2007)

Measurement tutorial CD helps engineers

Keithley Instruments has launched an interactive tutorial CD that helps test engineers with measurement operations. Brochure available

News from Keithley Instruments (22 February 2007)

Semiconductor parametric test handbook

Keithley Instruments, a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook. Brochure available

News from Keithley Instruments ( 5 February 2007)

Award for semiconductor test solutions

Keithley Instruments, a provider of solutions for emerging measurement needs, has been recognised for outstanding customer satisfaction by VLSI Research. Brochure available

News from Keithley Instruments ( 5 February 2007)

Test software for circuit materials testing

KTE V5.2 from Keighley provides a number of features that dramatically increase throughput for leading-edge circuit materials testing, such as those requiring RF level frequencies Brochure available

News from Keithley Instruments (15 December 2006)

Low Profile GPIB Controller Interface board

Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the Model KPCI-488LP Low Profile GPIB Controller Interface plug-in board. Brochure available

News from Keithley Instruments ( 4 December 2006)

Measurement for Semiconductor characterisation

Keithley Instruments has announced the release of KTE Interactive V6.1, an updated version of its powerful KTEI measurement software for its Model 4200-SCS Semiconductor characterisation System. Brochure available

News from Keithley Instruments (28 November 2006)

Hybrid test systems in production applications

Keithley Instruments has introduced a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments. Brochure available

News from Keithley Instruments (21 November 2006)

Probe cards for semiconductor parametric testers

Keithley Instruments has partnered with Mesatronic (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications. Brochure available