http://www.manufacturingtalk.com/news/kei/kei000.html Keithley Instruments news releases on Manufacturingtalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Fri, 19 Dec 2008 08:00:00 UT Fri, 19 Dec 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Keithley Instruments has introduced the Model 2308 portable battery/charger simulator, a dual-channel battery- and charger-simulating power supply for testing portable battery-powered devices. Thu, 25 Sep 2008 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei159.html Keithley Instruments has announced its Series 2600A system, the latest version of its Source Meter instrument platform. Thu, 25 Sep 2008 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei158.html Keithley Instruments has produced a free resource guide on CD that includes functional test, wafer level reliability, and production testing of electrical components. Wed, 21 May 2008 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei157.html Keithley Instruments has published its sixth edition of its free 'Switching Handbook: A Guide to Signal Switching in Automated Test Systems'covering test and measurement applications. Mon, 12 May 2008 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei156.html A test and measurement product guide details DC switching, RF switching and measurement, data acquisition, semiconductor test systems, and optoelectronics test hardware. Wed, 06 Feb 2008 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei155.html Keithley Instruments has introduced the Model 2100 61/2-Digit USB digital multimeter which is ideal production test, burn-in and manual and semi-automatic research and development applications Fri, 29 Jun 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei154.html Model 2910 V2.0 includes additional wireless signal generation waveforms, a new power calibration feature, and increased ARB memory Wed, 13 Jun 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei153.html Keithley Instruments has published a handbook on nanotechnology measurement, which offers practical assistance in making precision low level DC and pulse measurements on nanomaterials and devices. Tue, 17 Apr 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei151.html Keithley Instruments has announced the availability of ACS (Automated characterisation Suite) integrated test system for semiconductor characterisation at the device, wafer, and cassette level. Tue, 17 Apr 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei152.html Manufacturer of advanced electrical test instruments and systems reports that sales levels for the second quarter of fiscal 2007 fell short of the guidance range. Mon, 16 Apr 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei150.html Keithley Instruments has announced enhanced pulse and pulse i-v capabilities for its Model 4200-SCS semiconductor characterisation system. Thu, 05 Apr 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei149.html Keithley Instruments has announced its 2007 Test and Measurement Product Catalogue, including their general-purpose and sensitive-sourcing and measurement products. Tue, 27 Feb 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei148.html Keithley Instruments has launched an interactive tutorial CD that helps test engineers with measurement operations. Thu, 22 Feb 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei147.html Keithley Instruments, a provider of solutions for emerging measurement needs, has been recognised for outstanding customer satisfaction by VLSI Research. Mon, 05 Feb 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei146.html Keithley Instruments, a leader in solutions for emerging measurement needs, has published Parallel Test Technology: The New Paradigm for Parametric Testing, a semiconductor parametric test handbook. Mon, 05 Feb 2007 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei145.html KTE V5.2 from Keighley provides a number of features that dramatically increase throughput for leading-edge circuit materials testing, such as those requiring RF level frequencies Fri, 15 Dec 2006 08:00:00 UT Keithley Instruments http://www.manufacturingtalk.com/news/kei/kei144.html