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Semiconductor test system is selected

A Keithley Instruments product story
Edited by the Manufacturingtalk editorial team Feb 4, 2005

AMD has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

Keithley Instruments has announced that AMD has selected the Keithley Model S680 DC/RF Parametric Test System to support full production of advanced logic chips at AMD's new state-of-the-art 300mm Fab 36 located in Dresden, Germany.

The benefits of the S680DC/RF system include advanced measurement capability, lower cost of ownership through higher throughput, and strong local service and support.

"AMD's selection of the Keithley Model S680 demonstrates the system's acceptance as the parametric tester of choice for wafer-level electrical measurements for process control during high-volume manufacturing," stated Mark Hoersten, Keithley's vice president for business development.

"Manufacturers of both high-performance logic and high-performance analog Integrated Circuits are increasingly turning to Keithley to supply electrical parametric testers for the next-generation processes they are implementing in their most advanced fabs".

" These include 90nm and 65nm processes currently being deployed, along with their use in helping to develop the industry's most advanced 45nm processes." First marketed in 2003, Keithley's Model S680 DC/RF tester is designed for wafer-level parametric testing of wireless communications and high-speed digital devices.

This tester dramatically increases overall throughput by combining two critical test functions in a single system - DC and RF tests can be combined in the same test sequence.

This integrated approach eliminates the long calibration and test times typical of separate RF test solutions.

It also eliminates the need for a separate, costly, RF-only prober.

Furthermore, capabilities unique to Keithley's test systems such as parallel test enable IC manufacturers to minimize their cost of test.

For more information on the Model S680 DC/RF Parametric Test System or any of Keithley's semiconductor test solutions, contact the company at:www.keithley.com About Keithley Instruments With more than 50 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency) geared to the specialized needs of electronics manufacturers for high performance production testing, process monitoring, product development, and research.

By building upon our strength in electrical measurement solutions for research, Keithley has become a production test technology leader for the semiconductor, wireless, optoelectronics, and other precision electronics segments of the worldwide electronics industry.

The value we provide to our customers is a combination of precision measurement technology and a rich understanding of their applications, which enables them to improve the quality, throughput, and yield of their products.

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