Product category:
Electrical and Electronic Testing
News Release from: Keithley Instruments | Subject: Semiconductor characterisation
Edited by the Manufacturingtalk Editorial
Team on 17 April 2007
Faster and easier semiconductor testing
Keithley Instruments has announced the availability of ACS (Automated characterisation Suite) integrated test system for semiconductor characterisation at the device, wafer, and cassette level.
Keithley Instruments, a leader in solutions for emerging measurement needs, has announced the availability of ACS (Automated characterisation Suite) integrated test system for semiconductor characterisation at the device, wafer, and cassette level With ACS integrated test systems, Keithley has created a variety of highly configurable and flexible test systems for semiconductor characterisation that offer unique measurement capabilities with powerful automation-oriented software
This article was originally published on Manufacturingtalk on 5 Apr 2007 at 8.00am (UK)
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ACS test systems provide faster measurements and greater system flexibility under one uniform software suite to fit unique test application needs.
To learn more about Keithley's ACS integrated test systems, visit http://www.keithley.com/pr/070.
Under the unified Automated characterisation Suite, Keithley's ACS integrated test systems incorporate a variety of test hardware and overall unique measurement capability: Keithley's powerful Model 4200-SCS Semiconductor characterisation System features I-V source-measure and specialised pulse testing packages, such as the Model 4200-PIV package for testing of advanced semiconductor materials.
Further reading
System conforms to IEEE for checking nanotubes
Semiconductor characterisation System conforms to and supports the just-released Institute of Electrical and Electronic Engineers' standard for electrical testing of carbon nanotubes.
Precision sourcing and measurement guide published
Keithley Instruments has produced a free resource guide on CD that includes functional test, wafer level reliability, and production testing of electrical components.
Handbook covers test and measurement switching
Keithley Instruments has published its sixth edition of its free 'Switching Handbook: A Guide to Signal Switching in Automated Test Systems'covering test and measurement applications.
Series 2600 SourceMeter Instruments feature TSP-Link and Test Script Processor (TSP) for scalable I-V channel count systems, fast parallel measurements, and complex test sequences for applications such as on-the-fly NBTI or on-wafer component characterisation.
Series 2400 SourceMeter Instruments feature high voltage and high current sourcing, which are unique in applications such as high power MOSFETs and display drivers.
Optional switching, C-meters, and pulse generators round out the instrument capabilities of ACS integrated test systems.
ACS integrated test systems are available in basic bench-top configurations or in factory-integrated full-height rack configurations.
Meeting Test Challenges Semiconductor test engineers face a number of testing challenges.
On one hand, a range of unique measurements and novel techniques are necessary for emerging technologies such as scaled CMOS, LDMOS, and advanced memory technologies.
On the other hand, new technologies demand more testing and data collection with less time and fewer resources.
Until now, semiconductor test engineers have primarily relied on instruments that offer flexibility and unique measurements but require in-house or third party software development that impacts their company's time-to-market and increases overall cost of test.
Keithley's ACS integrated test systems address these needs by capitalizing on the flexibility and unique measurement capabilities of instruments and by providing the necessary software for flexibility and automation.
Keithley's new ACS systems are ideal for semiconductor parametric characterisation in R and D, technology development (TD), quality / reliability assurance (QRA), and small-scale production test.
Automation at the wafer or cassette level enables more unattended testing and collection of large statistical data samples for modeling and process qualification, as well as maximizing tool utilisation.
At the wafer level, Keithley's ACS integrated test systems feature a Wafer Description Utility and wafer map.
Users can easily build wafer description files with integrated test plans.
colour-coded wafer maps are updated in real-time during test execution to show pass/fail metrics, providing clear visibility into test results and assuring that test outcomes will be productive.
Another innovation is an interactive prober controller.
This allows users to control wafer movement using the ACS software during test development to validate test setups on actual structures and during lot disposition to navigate to a problem area of the wafer and execute testing manually.
A full range of drivers offers seamless integration with a range of semiautomatic and fully automatic probers.
Keithley's ACS integrated test systems are configured and integrated with Keithley's semiconductor applications expertise and customization capability.
This includes test routines such as macros, scripts, and custom GUIs in addition to interconnects, including cables, switching, probe card adaptation, as well as installation, training, and applications services. Request a free brochure from Keithley Instruments ...
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