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Boundary scan test software for TI DSPs
A
Kane Computing product story
Edited by the Manufacturingtalk editorial team
Apr 17, 2007
Kane Computing, the UK Distributor for Spectrum Digital, has announced the availability of a boundary scan test software package for DSP, the DiaTem Debugger, from Temento Systems.
Kane Computing, the UK Distributor for Spectrum Digital, has announced the availability of a boundary scan software package that supports and enhances the capabilities of the Spectrum Digital XDS510 USB PLUS JTAG emulator.
The DiaTem Debugger software has been created by Temento Systems, a leading supplier of boundary scan test software.
Using the XDS510 USB PLUS JTAG emulator and the DiaTem Debugger, the designer can now test the most critical portions of their target board that are connected via boundary scan logic.
This strongly decreases the number of variables in the debug activity, allowing to converge more rapidly in an efficient debug phase.
To achieve this, the new XDS510 USB PLUS JTAG emulator, with configurable EMU0/1 pins, provides the link between the DiaTem Debugger running on the HOST PC and the DSP on the target board.
The DiaTem Debugger can be used to initially bring up the target board efficiently and rapidly.
The DiaTem Debugger software allows the designer to describe his board in a few clicks and apply all Automatic Test Pattern Generators ( ATPG) for JTAG devices and clusters for non-JTAG devices.
This allows the detection and diagnosis of the most frequent board failures to ensure that the processor can reach all the memories and peripherals prior to loading any functional test code on the board.
The database of the board is automatically generated by DiaTem Debugger and is usable by other DiaTem stations to develop more tests; custom tests as well as run FPGA and Flash programming.
Key Components of the DiaTem Debugger Toolset The DiaTem Debugger provides the following features: 1) Boundary Scan chain Checker and a BSCAN Chain debug wizard tool 2) An interactive board debugger allowing the designer to check and/or force logic levels on any pin of his JTAG compliant devices 3) A net navigator providing cross checking between JTAG cells, device pins and net name 4) A large set of cluster generators to exercise automatic test vector generators to control connectivity with JTAG and non-JTAG components 5) A GUI to quickly design and run these tests without tedious programming 6) An immediate test appliance capability for rapid iterations 7) Compatibility with existing DiaTem JTAG testers with upgrade capability.
The new XDS510 USB PLUS JTAG emulator has the following features: 1) Supports TI's DaVinci technology, OMAP technology, TMS470 platform of ARM7 family-based general purpose processors (GPPs), TMS320C6000 DSP platform, TM320C64x DSP generation, TMS320C5000 and TMS320C2000 DSP platforms 2) Compatible with Code Composer Studio Integrated Development Environment, SFflash, and DiaTem Debuggers 3) Advanced emulation controller provides higher performance 4) Compatible with USB 1.x and USB 2.x (high speed) 5) Supports +1.8 to +5volt JTAG interfaces 6) Programmable TCK up to 32 Mhz 7) ARM Style Adaptive clocking support 8) Pin control over EMU0 and EMU1 for different debug modes 9) Compatible with Windows 2000 and XP Operating Systems.
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