Non-contact surface metrology for manufacturing
A Glasgow seminar for managers and engineers engaged in manufacturing or R+D, introducing surface metrology tools that use interferometry to provide fast and accurate non-contact measurements
The seminar will be of interest to those working in a number of sectors including: semiconductor, MEMS, defence, diamond turning, photonics, aerospace, automotive and medical devices.
The seminar will cover two of the precision tools for optical surface profiling including Scanning White Light and Fizeau Interferometers.
You will learn how they work, what they can be used for and what their limitations are.
There will be plenty of opportunity to see samples being measured on demonstration systems and for you to have your own parts measured - just let us have the samples in advance of the meeting.
Places are limited to 40 and will be allocated on a first come first served basis.
To book your place or for further details visit the website, or contact us by phone.
The event is supported by the Scottish Optoelectronics Association, and will take place in the afternoon of Thursday 8th May 2008, at the Dakota Eurocentral Hotel, M8, near Glasgow, Scotland.
Admission is free, but prior registration will be required.
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Tel +44 1582 764334
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