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Product category: Measurement systems
News Release from: L.O.T. - Oriel | Subject: KLA-Tencor Surface Profiler
Edited by the Manufacturingtalk Editorial Team on 09 March 2005

Stylus surface profiler makes 2D/3D
measurements

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Stylus surface profiler provides 2D and 3D topographic measurements of a wide range of surfaces and is ideal for step height, CMP, MEMS, LCD, flat panel and many other uses.

The next KLA-Tencor Surface Profiler workshop will take place on Wednesday the 27th April 2005, where both the Alpha-Step IQ 2D profiler, and the all new P-15 3D profiler will be on show The workshop will have a specialist from KLA-Tencor U.S

presenting the release of the newest generation of the market leading P-15 surface profiler.

Attendees are invited to bring samples a along to the workshop to run in the afternoon session.

Full analysis reports will be generated for every sample.

The market leading P-15 Stylus Surface Profiler from KLA-Tencor is capable of providing 2D and 3D topographic measurements with guaranteed 7.5 angstrom repeatability of a wide range of surfaces.

It is ideal for step height, CMP, MEMS, LCD, flat panel and many other applications.

The system now has a Windows XP operating system along with the new powerful 'Mountains' analysis software.

The budget Alpha-Step IQ Stylus Surface Profiler from KLA-Tencor has guaranteed 8 angstrom step height repeatability.

The software encompasses the most complete suite of two-dimensional analysis features on the market today and is perfect for a variety of surfaces including wafers, MEMs, ceramics, SIMs craters, microlenses and displays.

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