Product category:
Miscellaneous Instruments
News Release from: Lot-Oriel | Subject: Seminar of the ThermoScope II
Edited by the Manufacturingtalk Editorial
Team on 21 November 2006
Non destructive testing using pulsed
thermography
LOT - Oriel is conducting a one-day seminar of the ThermoScope II II and EcoTherm from Thermal Wave Imaging.
LOT - Oriel is conducting a one-day seminar of the ThermoScope II II and EcoTherm from Thermal Wave Imaging These systems provide a breakthrough in quantitative thermographic measurements for non-destructive testing
This article was originally published on Manufacturingtalk on 14 Jun 2006 at 8.00am (UK)
Related stories
Nanotechnology system has advanced features
Pacific Nanotechnology (PNI) has announced its new generation AFM system.
Starting with a short introduction by Dr Steve Shepard, President of Thermal Wave Imaging, the aim of the seminar is to show the present status of applications and research.
Using sample measurements we will demonstrate the thermal capabilities of the instruments.
You are strongly encouraged to bring samples along on the day (please provide a short sample description when registering).
The ThermoScope II and EcoTherm are the first products of their kind which combine a flash lamp system with a thermal imaging camera and analysis software offering fast, non-contact sub-surface imaging in a small lightweight unit.
They are able to detect the following defects:- * Adhesive disbonds * Density/porosity * Thickness and depth measurement * Delamination * Impact damage * Wall thickness and disbonds in thermal barrier coating turbine blades As well as composite materials, these systems can also be used for metals, plastics in aerospace and automotive applications.
• Lot-Oriel: contact details and other news
• Email this article to a colleague
• Register for the free Manufacturingtalk email newsletter
• Manufacturingtalk Home Page
Search the Pro-Talk network of sites
