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News Release from: Mantech Solutions | Subject: Optical scanning multi-axis measurement system
Edited by the Manufacturingtalk Editorial
Team on 07 June 2006
Optical scanning multi-axis measurement
system
Centrax purchased a computer-controlled optical multi-axis measurement system from Steintek follows extensive trials comparing the company's 'white light' scanning technology with CMMs.
Centrax 's decision to purchase a computer-controlled optical multi-axis measurement system from Steintek follows extensive trials comparing the German company's 'white light' scanning technology with conventional co-ordinate measuring machines equipped with both touch probe and optical scanning devices The Newton Abbot, Devon supplier of high quality components and assemblies to original equipment gas turbine engine manufacturers world-wide opted for Steintek's automated system on the basis of achieving the shortest possible measuring times without detriment to measuring accuracy
This article was originally published on Manufacturingtalk on 22 Aug 2000 at 8.00am (UK)
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According to Centrax' Kevin Vickers: "We were faced with the prospect of having to purchase several touch probe CMMs in order to keep pace with production during ramp-up of our blisc manufacturing programme.
However, during our evaluation of the CMM market place we discovered that the Steintek system would measure our reflective components without the need for matt coating.
Trials at the Steintek HQ then proved that the machine was significantly faster that other systems that we considered, so a single machine would suffice for the planned output.
The expertise and professionalism which were evident during the trial gave us the confidence to adopt this new technology." Rugby-based Mantech Solutions , Steintek's partner in the UK, points out that the Steintek system has an overall system accuracy of +/- 10 micron, even when measuring highly reflective materials.
It can also measure leading and trailing edges with radii of less than 0.2 mm.
Other features include parameterised programs.
Together with software for the measurement and evaluation of complex aerofoil sections, the Steintek system provides real-time processing and graphics display of results with automated alignment and different best-fit options.
"We are very pleased to have the opportunity of providing Centrax with improvements in production time," says Eliana De Santis, Steintek's President, "by minimising the time needed to inspect parts and maximising its gains with the processing speed and flexibility of the Steintek system.".
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