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Metryx
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Address:
Unit 2 Manor Park
Nailsea Wall Lane, Nailsea
Bristol
BS48 4DD
UK
Telephone: (UK) +44 127 586 6260
http://www.metryx.net
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Listing of all 7 news releases from Metryx:
Experience in semiconductor manufacturing industry
Elton Peace is joining the Advisory Board of Directors of Metryx.
News from Metryx (10 March 2006)
North American technology director appointed
Provider of novel nanotechnology weight metrology equipment, Metryx, has appointed Liam Cunnane as technology director for North America.
News from Metryx ( 9 February 2006)
Tool measures wafers to atomic levels
A non-destructive, nanotechnology weight metrology tool - to handle high volume production of 300mm semiconductor wafers - offers atomic layer measurement accuracy.
News from Metryx (12 January 2006)
Tool offers atomic layer measurement accuracy
Metrology specialist, has unveiled an innovative nanotechnology weight metrology tool that offers atomic layer measurement accuracy and is designed to handle the demands of volume production.
News from Metryx (15 December 2005)
$4m nanotechnology metrology tools sold
Metryx has won orders for up to $4million for its revolutionary Mentor high-throughput, simple-to-use, non-destructive metrology tool that offers atomic layer measurement accuracy.
News from Metryx ( 5 October 2005)
Atomic layer measurement accuracy for R and D
A manual, benchtop non-destructive R and D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx.
News from Metryx (13 September 2005)
Metrology tool assesses wafer process success
Utilising non-destructive measurement on production wafers, a metrology tool can directly assess from SPC methodology whether a process has been carried out successfully.
News from Metryx (28 July 2005)
