http://www.manufacturingtalk.com/news/miz/miz000.html Metryx news releases on Manufacturingtalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Sat, 25 Oct 2008 08:00:00 UT Sat, 25 Oct 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Elton Peace is joining the Advisory Board of Directors of Metryx. Fri, 10 Mar 2006 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz106.html Provider of novel nanotechnology weight metrology equipment, Metryx, has appointed Liam Cunnane as technology director for North America. Thu, 09 Feb 2006 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz104.html A non-destructive, nanotechnology weight metrology tool - to handle high volume production of 300mm semiconductor wafers - offers atomic layer measurement accuracy. Thu, 12 Jan 2006 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz103.html Metrology specialist, has unveiled an innovative nanotechnology weight metrology tool that offers atomic layer measurement accuracy and is designed to handle the demands of volume production. Thu, 15 Dec 2005 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz102.html Metryx has won orders for up to $4million for its revolutionary Mentor high-throughput, simple-to-use, non-destructive metrology tool that offers atomic layer measurement accuracy. Wed, 05 Oct 2005 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz101.html A manual, benchtop non-destructive R and D metrology tool that offers atomic layer measurement accuracy to 7 angstroms of oxide has been launched by Metryx. Tue, 13 Sep 2005 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz105.html Utilising non-destructive measurement on production wafers, a metrology tool can directly assess from SPC methodology whether a process has been carried out successfully. Thu, 28 Jul 2005 08:00:00 UT Metryx http://www.manufacturingtalk.com/news/miz/miz100.html