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News Release from: Metryx
Edited by the Manufacturingtalk Editorial
Team on 09 February 2006
North American technology director
appointed
Provider of novel nanotechnology weight metrology equipment, Metryx, has appointed Liam Cunnane as technology director for North America.
Provider of novel nanotechnology weight metrology equipment, Metryx, has appointed Liam Cunnane as technology director for North America Cunnane brings to Metryx over 20 years' experience in the semiconductor capital equipment industry - notably with Electrotech, and then as North American engineering manager for Trikon Technologies
This article was originally published on Manufacturingtalk on 13 Sep 2005 at 8.00am (UK)
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As technology director, Cunnane will bring this experience to bear in supporting specialist Metryx agents located in almost 30 states.
Cunnane comments: "Metryx has a unique technology which has immense potential in device production.
This has been demonstrated by the growth and success of the company in a short space of time.
It is exciting to be part of such a dynamic team, and to be able to assist the integration of leading edge technology into volume production environments." Metryx technology for atomic layer accuracy in metrology and SPC in wafer processing applications is endorsed by major 200mm and 300mm fabs worldwide.
Vice president and co-founder of the company, Dr Adrian Kiermasz, adds: "Liam's experience and knowledge of semiconductor processing and equipment assures expert support to our agents and customers in North America, and continues to strengthen the Metryx global infrastructure.".
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