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Particle shape determined with image analysis
A
Malvern Instruments product story
Edited by the Manufacturingtalk editorial team
Mar 3, 2005
Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size.
Malvern Instruments has launched a new generation image analysis system for the fully automated characterization of particle shape and size.
Introduced at Pittcon 2005, the Sysmex FPIA-3000 builds on the success of the existing Sysmex FPIA-2100 flow cytometry-based analyzer, adding new features and extending the range of applications.
In addition to the laboratory system, a remote option will be available for use in at-line situations.
Particle shape analysis has become a critical parameter in many industrial processes.
This has fuelled a demand for increasingly flexible analytical systems that can be used in a variety of different circumstances to provide maximum shape and size information quickly and easily.
Key amongst the new features of the Sysmex FPIA-3000 is its ability to measure across a wide particle size range.
The standard instrument configuration allows the characterization of particles from 1.5 to 160 microns.
High and low magnification options cover the ranges 0.8 to 80 microns and 12 to 300 microns respectively.
Sample volumes as low as 0.5 ml can be used throughout and every single particle image is now stored for future reference and analysis.
Powerful new software brings access to a whole range of new shape and size parameters not previously available, as well as improved threshold control that allows more sensitive edge detection for transparent particles.
The Sysmex FPIA-3000 operates using the same proven principles as its predecessor, measuring particles suspended in aqueous and non-aqueous liquid media.
Using a CCD camera, the system produces images of each suspended particle.
Samples pass through a sheath flow cell that transforms the particle suspension into a narrow, flat flow, ensuring that the largest area of the particle is oriented towards the camera and that all particles are in focus.
Measurement is complete in just two and a half minutes.
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