Product category:
Materials Testing
News Release from: Malvern Instruments | Subject: High sensitivity particle image analyser
Edited by the Manufacturingtalk Editorial
Team on 22 January 2007
High sensitivity particle image analyser
New software for the Morphologi G2 high sensitivity particle image analyser from Malvern Instruments incorporates a plate tracking facility that further enhances its accuracy.
New software for the Morphologi G2 high sensitivity particle image analyser from Malvern Instruments incorporates a plate tracking facility that further enhances its accuracy, especially at high magnifications The new function allows the system to recognise and compensate for any tilting of the sample plate, resulting in improved optical focus
This article was originally published on Manufacturingtalk on 9 Jan 2008 at 8.00am (UK)
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Supplied as an integral part of any new purchase, the upgrade is being provided free of charge to existing Morphologi G2 customers.
Using four reference points at the corners of the scanning area, the plate-tracking function attaches a 'z-position' to each 'xy' co-ordinate.
Cross-hairs locate the z-position of the surface of the glass sample carrier at the four corners of the measurement area, and from these the software can calculate tilt of the plate, thus allowing automatic adjustment of the z-drive to compensate for any tilt.
This ensures that the distance between the optics and glass surface remains constant, maximizing measurement accuracy.
Incorporating the latest optics and a high resolution digital Firewire camera, the Morphologi G2 delivers exceptional image quality.
Simple-to-use, it is capable of measuring hundreds of thousands of particles in minutes, providing statistical size and shape data with no operator bias. Request a free brochure from Malvern Instruments ...
It is particularly valuable for applications where there is sensitivity to shape and/or the presence of fines.
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