Product category:
Non-contact, Optical and Laser measurement systems
News Release from: Polytec | Subject: Measurement Services Program
Edited by the Manufacturingtalk Editorial
Team on 31 January 2007
Non-contact vibration and topography
measurement
Polytec has announced a new Measurement Services Program that makes advanced non-contact vibration and topography measurements available for every budget.
Polytec has announced a new Measurement Services Program that makes advanced non-contact vibration and topography measurements available for every budget The innovative program provides engineers with measurement results using Polytec's latest, non-contact measurement technology and, if needed, the expert advice and skill of a Polytec applications engineer
This article was originally published on Manufacturingtalk on 22 Sep 2006 at 8.00am (UK)
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By eliminating the need for a capital purchase and/or the addition of dedicated manpower, the new Measurement Services Program gets precision results in the hands of engineers who have short-notice critical needs, require occasional measurements where a purchase is not justified, wish to evaluate Polytec products prior to purchase or prefer to contract a service.
Via the program, test structures are characterized with state-of-the-art equipment such as 1-D and 3-D scanning laser vibrometers, single-point vibrometers, microstructure (MEMS) motion analysers and topography measurement systems, operated by knowledgeable and experienced application engineers.
The measurement technology is fundamentally nondestructive, works on most surface finishes, eliminates mass-loading, improves data accuracy and minimizes contact transducer mounting, wiring, and signal conditioning.
Vibrometer systems characterise virtually anything that vibrates up to 30 m/s or 30 MHz, down to picometer resolution.
Tests may be run at the customer's facility or in one of three Polytec labs in North America: Detroit, Los Angeles and Boston.
Complete measurement results are provided to the customer and may include frequency response functions, operational deflection shapes, time and frequency domain response, 3-D motion vectors, in-plane and out-of-plane MEMS dynamics, structure geometry and surface topography.
Data can be exported in several formats for further processing such as FE correlation and modal analysis.
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