Product category:
Electrical and Electronic Testing
News Release from: Seica | Subject: Aerial Flying Probe test systems
Edited by the Manufacturingtalk Editorial
Team on 15 November 2006
High fault coverage, fast throughput for
PCB test
Seica will present a new addition to its line of Flying Probe test systems, Aerial, to address the growing demand to provide cost-effective test solutions.
Seica will present a new addition to its line of Flying Probe test systems, Aerial, to address the growing demand to provide cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test Aerial is based on the core hardware and software of the VIVA Integrated Platform (VIP*) and uses four completely independent, mobile test probes to carry out tests on both sides of the board under test (two on each side)
This article was originally published on Manufacturingtalk on 7 Apr 2004 at 8.00am (UK)
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The VIVA Integrated Platform is based on a unique software and hardware architecture including cutting-edge technology to implement test strategies needed for the challenges of electronic testing.
It is particularly indicated for testing prototypes, samples, small and medium series, providing maximum flexibility of use to reduce the time and costs of board development.
The vertical, very compact structure of Aerial M4 makes it easy to load and test even very large boards and its innovative clamping system ensures that there is virtually no vibration or oscillation of the board during test for maximum probing efficiency.
As the standard electrical test, Aerial uses the Seica proprietary OTPN (One Touch Per Net) technique: multi-tone signals are injected through the nets of the UUT and the results are analysed with Fast Fourier Transforms (FFT) to characterise the net and identify faults on subsequent boards to be tested.
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Other tests, for example verification of junction faults, are also executed during the same OTPN.
In this way test program generation is simple and immediate, fault coverage is high and throughput is maximised.
"The Aerial represents a simple, immediate solution to those customers who need to implement a test Strategy that is cost-effective and is very easy to program and operate, even for non-specialised personnel", says Antonio Grassino, President of Seica.
Options include the in-circuit test and visual inspection software modules and the system is provided with data collection and statistics functions, and, since it is based on VIP technology, it is fully compatible with the other members of the Seica family: Pilot Flying Probe, Strategy In-circuit and Valid Functional testers.
Seica will also showcase it's innovative Pilot VIP Flying Probe system, a full-performance test system that integrates a complete set of test tools and techniques that go beyond the conventional definition of "flying prober".
It is another product in Seica's portfolio of automated test solutions, and includes a SMEMA conveyor, which is completely user-programmable to suit various manufacturing and test process layouts.
The system includes the hardware and software features of Seica's unique VIVA Integrated Platform, and can be fully loaded to cover the full range of in-circuit and functional tests, as well as providing additional capabilities such as AOI Inspection, Boundary-scan and On-board programming.
The Strategy TK on display at Electronica 2006 epitomises the type of test solutions offered by Seica's Strategy product line.
In this case, the VIP-based solution is "combi", including all of the resources required for comprehensive in-circuit and functional test performance, operating in a fully integrated Labview/TestStand environment.
In fact, thanks to the open architecture inherent to Seica's Viva Integrated Platform**, any Strategy system can have a virtually unlimited range of applications, while maintaining the advantages of a test system based on a clearly defined internal architecture.
This is particularly important for those users who would like to migrate their existing in-house "custom" test, already operating under Labview/Teststand, to an expandable, flexible in-circuit or functional test solution, while maintaining the same "look and feel" of their test process.
Its extremely high level of configurability in terms of instrumentation and performance, make the Strategy TK platform suitable for testing both new product and for the repair of boards and/or assemblies from the field.
* Viva Integrated Platform* is a registered trademark of Seica SPA ** Labview and Teststand are registered trademarks of National Instruments Corp.
Seica will also be showing the Firefly, the latest addition to its portfolio of solutions for the electronics industry, designed to meet the increasing need for automatic selective soldering, using the power of laser technology.
Firefly is also based on Seica's VIVA Integrated Platform, offering all of the advantages of the simple, three step process for generating, verifying and running a soldering program.
It also has additional software tools that can be used to further optimize system flexibility and performance.
The integrated temperature control system provides continuous feedback during the soldering process, with real-time, on-screen display of the thermal profiles.
Firefly is equipped with a SMEMA board conveyor system for easy integration into any production line.
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