Product category:
Electronics manufacturing: quality control equipment, software
News Release from: Unitemp | Subject: Rapid rate thermal cycle test chamber
Edited by the Manufacturingtalk Editorial
Team on 23 May 2006
Rapid rate thermal cycle chamber tests
electronics
A rapid rate thermal cycle chamber for testing and monitoring miniaturised high density semiconductor devices provides a rapid temperature change of at least 20 deg C/minute.
A rapid rate thermal cycle chamber for testing and monitoring miniaturised high density semiconductor devices provides a rapid temperature change of at least 20 deg C/minute Unitemp announce the availability of a new rapid rate thermal cycle chamber designed primarily for the testing and monitoring of miniaturised high density semiconductor devices and other electronic / electrical devices, automotive components and other selected products
This article was originally published on Manufacturingtalk on 30 Jun 2008 at 8.00am (UK)
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Designated the TCC-150W model from ESPEC it provides a rapid temperature change of at least 20 deg C/min, and offers high performance cycles with linear control capacity at a maximum 15 deg C/min with specimens.
Temperature range is -70 to 180 deg C.
The unit has a loading capacity of 160 litres with inside dimensions of 800 x 500 x 400mm and is constructed from top quality stainless steel and designed to occupy the minimum of floor space.
The control panel is door mounted with an easy to read LCD touch screen instrumentation, which allows users to operate by displayed instructions.
The screen shows confirmation of test patterns, test area temperatures and cycles and trend graph displays, etc This product complements Unitemps extensive range of test chambers, and they have the expertise to provide 'specials' to customers requirements.
These versatile products have applications in the electronics, engineering, laboratory, process and manufacturing Industries.
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