Product category:
Non Destructive Testing
News Release from: X-Tek Systems | Subject: X-ray inspection systems software upgrades
Edited by the Manufacturingtalk Editorial
Team on 14 February 2003
Software upgrades boost X-ray inspection
operation
Software upgrades for real-time microfocus X-ray inspection systems include a 3D waterfall display that can be generated from a 2D image and an auto-focusing feature for all applications.
X-Tek has today announced the launch of a range of software upgrades available across its range of world-leading real-time microfocus X-ray inspection systems A total of five new features are on release and available free of charge to any customers who have purchased X-Tek systems within the last two years
This article was originally published on Manufacturingtalk on 28 Sep 2006 at 8.00am (UK)
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They include a 3D waterfall display that can be generated from a 2D image, an auto-focusing feature for all applications and improved support for the use of the latest flat panel sensors.
Two upgrades specifically designed for the electronics inspection market are a drill offset measurement tool for PCB inspection and a Microsoft Excel output facility designed for BGA results analysis.
X-Tek has also announced that from the end of March it will offer a full Windows XP support for customers wishing to migrate from Windows 2000.
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The 3D waterfall display can make it easier for operators and any of their colleagues without radiographic training to interpret X-ray images.
The auto focusing facility eliminates the requirement for this routine manual maintenance task.
The improved support for flat panel sensors includes the latest generation of amorphous silicon products.
The drill offset measurement tool measures any errors in the drill position for multi-layer PCBs.
Paul Ramsay, Sales and Marketing Manager at X-Tek states: "All of these upgrades have been developed in specific response to requests from customers using X-Tek machines.
Together they offer the potential to significantly increase functionality and ease of use across a wide range of X-ray inspection applications including electronics and avionics; semiconductor packaging and the non destructive testing of castings, ceramics and composites and other opaque materials." X-Tek expects to release further software upgrades throughout 2003 as part of its continuing product improvement programme.
About X-Tek Systems - part of the X-Tek Group, X-Tek Systems is the premier manufacturer of real-time microfocus X-ray inspection equipment and high-resolution vacuum de-mountable X-ray sources.
Its range of high quality microfocus X-ray systems offers high resolution, high-power, low maintenance and low cost of ownership.
The X-Tek product range includes low cost bench-top systems, suitable for lightweight components, up to larger units with more complex functions, useful for inspecting electronic assemblies or engineering components in great detail.
X-Tek maintains a world-wide agent network and has a rapidly expanding international user base with installations throughout Asia, the USA and Western Europe.
Major multinational companies using X-Tek equipment include AMD, Ericsson, Ti, IBM, Motorola and ASAT.
X-Tek real-time microfocus X-ray inspection equipment is used in a wide range of applications including: electronics; semiconductor packaging; non destructive testing, pharmaceutical, medical research; automotive; aerospace; nuclear; construction, ceramics, composites, food, defence and security.
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