Product category:
Materials Testing
News Release from: X-Tek Systems | Subject: X-ray inspection system
Edited by the Manufacturingtalk Editorial
Team on 09 February 2007
X-ray inspection system and validation
station
X-Tek has announced a camera and detector combination for the Revolution NanoTech X-ray inspection system and a validation station for enhanced production capability.
The X-Tek Group, manufacturers of real-time microfocus X-ray systems, will announce the inclusion of a camera and detector combination for the Revolution NanoTech X-ray inspection system and a validation station for enhanced production capability at APEX, stand 2237 Visitors to the X-Tek stand will also be able to experience a demonstration of Computerized Tomography (C.T.), a powerful new 3D imaging capability to the industry leading Revolution system
This article was originally published on Manufacturingtalk on 14 Feb 2003 at 8.00am (UK)
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Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution.
The camera boasts real-time frame rates at full camera resolution and full dynamic range.
Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
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The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components.
Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies.
The Impix camera will also enhance the CT option on the Revolution by further improving the voxel resolution capability.
The validation station option allows viewing/reviewing of captured data off line, enabling continued use of the x-ray system for production.
Data can be accessed remotely by serial number or by barcode scanning.
X-Tek's CT capability has recently received extensive global recognition.
X-Tek pioneered a powerful new X-ray source which allowed an international team of researchers to reveal the true purpose of one of the most technically advanced artefacts from the Greek Classical world, the Antikythera Mechanism.
X-Tek specifically developed a new 450kV microfocus X-ray source for the project, a dramatic advancement over the conventional 225kV source.
The results from X-Tek's new C.T.
system provided researchers with new material and enabled them to read inscriptions that had never been seen before.
C.T.
produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects.
X-Tek has made true 3D imaging available, affordable and simple to use for fast internal analysis, measurement, reverse engineering and product verification.
The Revolution features sub-micron defect detection, 75 degree oblique viewing, digital detectors and automatic BGA software.
Offering the highest degree of off axis tilt available and NanoTechT open tube technology for unparalleled resolution and magnification, visitors are invited to bring a sample with them to the X-Tek stand (2237) to test the system's capability.
The Revolution offers maximum magnification (up to 6000x) at all angles over the entire 16" x 16" (410mm x 410mm) manipulator scan area, for 100% BGA , uBGA , multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.
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