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Product category: Materials Testing
News Release from: Yokogawa Europe - Test and Measurement | Subject: VN7100 wideband modulation analyser
Edited by the Manufacturingtalk Editorial Team on 07 June 2004

Modulation Analyser Has High Bandwidth

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The new VN7100 wideband modulation analyser from Yokogawa Measurement Technologies features a maximum analysis bandwidth of 168 MHz the world' s highest for this product class.

The new VN7100 wideband modulation analyser from Yokogawa Measurement Technologies features a maximum analysis bandwidth of 168 MHz - the world' s highest for this product class - making it ideally suited to the development and evaluation of the next generation of mobile and wireless LAN systems The instrument is designed to be upgradeable with software options so that it 'future-proofed' for addressing new wireless technologies as they emerge

The VN7100 is a single-box solution integrating an RF down-convertor, digitiser and computer in a compact, lightweight package measuring 426 ? 176 ? 450 mm and weighing 19 kg.

A 12-bit, 210 MS/s A/D convertor enables fast, high-resolution measurements, while the long memory (1 Gbyte SRAM with 128 M points per channel) makes it possible to measure for long periods or - by dividing up the acquisition memory - to carry out measurement and analysis operations simultaneously.

Measurements carried out by the VN7100 include time-domain analysis, frequency-domain analysis, statistical analysis (including CCDF power measurements) and I/Q output (demodulation) analysis.

Up to four measurements - including eye-diagram and constellation plots - can be displayed at once.

The instrument uses FFT (Fast Fourier Transform) techniques which offer a number of benefits over the traditional swept-oscillator approach: in particular, the ability to view spectrum and modulation simultaneously as well as carrying out re-calculation or analysis of data stored in the memory.

Optional software is available for WLAN analysis and testing compliance to the IEEE 802.11a/b/g standard, including EVM and continuous BER (bit error rate) measurements.

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