Product category:
Materials Testing
News Release from: Yokogawa Europe - Test and Measurement | Subject: AQ2200-601
Edited by the Manufacturingtalk Editorial
Team on 19 July 2005
10 Gbit/s bit-error-rate tester for
modular system
Yokogawa has introduced a 10 Gbit/s bit-error-rate tester to the range of modules available for the company's AQ2200 Series modular optical instrumentation system.
Yokogawa has introduced a 10 Gbit/s bit-error-rate tester to the range of modules available for the company's AQ2200 Series modular optical instrumentation system The new AQ2200-601 integrates a pulse pattern generator, error detector and signal generator - all the essential elements in bit-error-rate measurements - in a compact module
This article was originally published on Manufacturingtalk on 17 Jun 2005 at 8.00am (UK)
Related stories
Compact bit-error-rate testers for networks
Yokogawa has introduced two compact, easy-to-use and economical instruments for 10 Gbit/s bit-error-rate testing.
Yokogawa puts SL1000 data unit to the test
The new Yokogawa SL1000 is a PC-based data-acquisition unit designed to provide high-speed data logging and fast data transfer in electro-mechanical and power measurement applications
Optical spectrum analyser has high resolution
Optical spectrum analyser combines a wide wavelength range of 1200 to 2400nm with high resolution between 50pm and 2nm and high sensitivity of -70 dBm or better.
When combined with other AQ2200 Series modules such as optical modulators, receivers, power meters and attenuators, it provides all the facilities required for error-rate curve measurements and optical device characterisation.
The pulse pattern generator function can generate patterns up to 256 bits in length (optionally extendable to 64 Mbit) including pseudo-random binary signals (PRBS) from PRBS7 to PRBS31, with support for multiple bit rates from 9.95 to 11.32 Gbit/s, variable in steps of 1 kHz.
The 64 Mbit option support SDH/SONET frame programming.
Other adjustable parameters include output amplitude (0.5 to 2.0 V peak-to-peak in steps of 10 mV), offset (-2.0 to +3 V in steps of 10 mV), and crosspoint (30% to 70% in steps of 1%).
A trigger output is provided for oscilloscope synchronisation, as well as a port for external 10 Gbit/s clock synchronisation input and 1/16 or 1/64 synchronisation input.
This makes it possible to perform an error rate test with jitter deliberately added to the data pattern.
A clock and data recovery (CDR) function extracts the clock from the data signal and performs synchronisation when a data signal is the only input.
In optical communications, the CDR function is a useful tool because the data signal is often transmitted alone.
In addition to the CDR input port, there are ports for separate data and clock signal inputs.
The AQ2200-601 can be used with the AQ2201 3-slot or AQ2202 9-slot mainframes to form a complete compact, lightweight optical measurement system that optimises the use of laboratory bench space and is easily portable.
• Yokogawa Europe - Test and Measurement: contact details and other news
• Email this article to a colleague
• Register for the free Manufacturingtalk email newsletter
• Manufacturingtalk Home Page

