Product category:
Materials Testing
News Release from: Yokogawa Europe - Test and Measurement | Subject: Optical time-domain reflectometer.
Edited by the Manufacturingtalk Editorial
Team on 15 May 2006
Optical time-domain reflectometer
A triple-wavelength module that adds 1625 nm capability to the standard 1310 and 1550 nm wavelengths has been added to the options available for Yokogawa's AQ7260 optical time-domain reflectometer.
A triple-wavelength module that adds 1625 nm capability to the standard 1310 and 1550 nm wavelengths has been added to the range of options available for the Yokogawa AQ7260 optical time-domain reflectometer (OTDR) The 1625 nm wavelength offered by the new AQ7265S1 SMF module is particularly relevant to the measurement of bending losses, and increases the versatility of the instrument in optical-fibre installation applications
This article was originally published on Manufacturingtalk on 22 Apr 2008 at 8.00am (UK)
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The new module is designed for measurements on SM (ITU-T G.652) fibres, and offers a 2-metre (typical) event dead zone and enough dynamic range for the measurement of the optical fibre cable length.
Ten pulse-width ranges are available between 10 ns and 20 microseconds.
The AQ7260 OTDR covers a wide range of applications in the installation and servicing of optical networks, and is offered with a variety of OTDR modules and optional units.
It has a minimum sampling resolution of 5 cm and a maximum of 60,000 sampling points.
The unit has a large (8.4 inch) TFT-LCD colour display for easy viewing in sunlight, and a large internal memory capacity of 20 Mbyte.
USB ports are incorporated for connectivity and data storage.
It has a user-friendly interface and a multi-language function.
Dimensions are 299 x 225 x 62 mm and weight is approximately 3 kg.
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